Now showing items 1-1 of 1

  • .

    .

    .

    Scanning speed phenomenon in contact-resonance atomic force microscopy 

    Glover, Christopher C.; Killgore, Jason P.; Tung, Ryan C. (2018)
    This work presents data confirming the existence of a scan speed related phenomenon in contact-mode atomic force microscopy (AFM). Specifically, contact-resonance spectroscopy is used to interrogate this phenomenon. Above ...