If you have any problems related to the accessibility of any content (or if you want to request that a specific publication be accessible), please contact us at firstname.lastname@example.org.
Now showing items 1-1 of 1
Scanning speed phenomenon in contact-resonance atomic force microscopy
This work presents data confirming the existence of a scan speed related phenomenon in contact-mode atomic force microscopy (AFM). Specifically, contact-resonance spectroscopy is used to interrogate this phenomenon. Above ...